发明名称 SEMICONDUCTIVE ROLLER OF AN IMAGE-FORMING APPARATUS
摘要 A semiconductive roller to stably generate high-quality images for a long period of time by efficiently inhibiting migration of free epichlorohydrin (ECH) component to a surface of the semiconductive roller includes an elastic layer formed of a semiconductive rubber composition including about 50 to about 70 parts by weight of a base rubber and about 30 to about 50 parts by weight of a hydrin rubber. An extracted amount of the ECH component from the elastic layer is about 2% by volume or less, wherein the extracted amount is determined based on a reduced amount of chlorine (Cl) intensity measured using X-ray fluorescence (XRF) analysis performed before and after extraction of the ECH component from the elastic layer using tetrahydrofuran (THF).
申请公布号 US2015087488(A1) 申请公布日期 2015.03.26
申请号 US201414168422 申请日期 2014.01.30
申请人 Samsung Electronics Co., Ltd 发明人 KANG Kwang-ho;JEONG Jae-hyeuk;CHOI Jung-ik
分类号 B05C1/08;G03G15/16;H01B1/12 主分类号 B05C1/08
代理机构 代理人
主权项 1. A semiconductive roller, comprising: an elastic layer formed of a semiconductive rubber composition comprising about 50 to about 70 parts by weight of a base rubber and about 30 to about 50 parts by weight of a hydrin rubber, wherein an extracted amount of an epichlorohydrin (ECH) component from the elastic layer is about 2% by volume or less, wherein the extracted amount is determined based on a reduced amount of chlorine (Cl) intensity measured using X-ray fluorescence (XRF) analysis performed before and after extraction of the ECH component from the elastic layer using tetrahydrofuran (THF), wherein the extracted amount of the ECH component is calculated using a calibration curve, which is obtained by the XRF analysis, indicating a correlation between concentrations (in % by volume) of epichlorohydrin (ECH) contained in a plurality of the THF solutions comprising known different concentrations of ECH and the corresponding chlorine (Cl) intensities (in cps/μA) of the plurality of the THF solutions measured by the XRF analysis.
地址 Suwon-si KR