发明名称 |
THIN FILM STRUCTURE AND PRODUCTION METHOD FOR SAME |
摘要 |
The present invention concerns a thin film structure wherein the gallium nitride bonding density can be markedly reduced and a production method for same. Provided is a thin film structure comprising a sapphire-containing supporting substrate, and comprising an epitaxial layer which is disposed on the supporting substrate and contains gallium nitride; and the upper part of the supporting substrate facing the epitaxial layer is made of a layer wherein silicon is either diffused or ion implanted through the upper surface of the supporting substrate. |
申请公布号 |
WO2015041390(A1) |
申请公布日期 |
2015.03.26 |
申请号 |
WO2014KR01290 |
申请日期 |
2014.02.18 |
申请人 |
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION |
发明人 |
HAN, HEUNG NAM;LEE, SUNG BO |
分类号 |
C30B29/38;C23C14/48 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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