| 发明名称 |
CURRENT SOURCE DRIVEN MEASUREMENT AND MODELING |
| 摘要 |
A method and apparatus for testing integrated circuit resistors includes applying a variable source current to a resistive device under test (DUT), measuring the resistance of the resistive DUT as a function of the source current, and fitting the measured resistance to parameters of a polynomial parametric equation, wherein the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance multiplied by the square of the current. |
| 申请公布号 |
US2015084653(A1) |
申请公布日期 |
2015.03.26 |
| 申请号 |
US201314038608 |
申请日期 |
2013.09.26 |
| 申请人 |
QUALCOMM Incorporated |
发明人 |
Song Young K.;Hwang Kyu-Pyung;Kim Dong Wook;Yun Changhan Hobie |
| 分类号 |
G01R27/02;G01R31/28 |
主分类号 |
G01R27/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of testing integrated circuit resistors comprising:
applying a variable source current to a resistive device under test (DUT); measuring the resistance of the resistive DUT as a function of the source current; and fitting the measured resistance to parameters of a polynomial parametric equation, wherein the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance times the square of the current. |
| 地址 |
San Diego CA US |
