| 发明名称 |
INSPECTION APPARATUS AND INSPECTION SYSTEM |
| 摘要 |
An inspection apparatus of an embodiment includes a transmitting antenna device connected to a transmitting unit including a transmitting device configured to transmit a microwave, and a receiving antenna device connected to a receiving unit including a receiving device. Each of the transmitting antenna device and the receiving antenna device faces a subject to be inspected. The receiving antenna device receives at least one of a microwave transmitted from the transmitting antenna device and penetrating the subject to be inspected, a microwave of which phase has been delayed, and a microwave diffracted in the subject to be inspected. The receiving unit is a directional antenna. |
| 申请公布号 |
US2015084645(A1) |
申请公布日期 |
2015.03.26 |
| 申请号 |
US201414483705 |
申请日期 |
2014.09.11 |
| 申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
KAYANO Hiroyuki;HIRAOKA Toshiro |
| 分类号 |
G01S13/88;G01S13/04 |
主分类号 |
G01S13/88 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An inspection apparatus comprising:
a transmitting antenna device connected to a transmitting unit including a transmitting device configured to transmit a microwave; and a receiving antenna device connected to a receiving unit including a receiving device, wherein each of the transmitting antenna device and the receiving antenna device faces a subject to be inspected, the receiving antenna device receives at least one of a microwave transmitted from the transmitting antenna device and penetrating the subject to be inspected, a microwave of which phase has been delayed, and a microwave diffracted in the subject to be inspected, and the receiving unit is a directional antenna. |
| 地址 |
Minato-ku JP |
