发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANKS INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD AND PHOTOMASK
摘要 An actinic ray-sensitive or radiation-sensitive resin composition includes; a compound (A) which generates an acid by irradiation with actinic rays or radiation, wherein the acid is linked with a group represented by the following general formula (M) through covalent bonding. In the formula, Y1 and Y2 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an alkenyl group, an alkynyl group, an aryl group, or an acyl group. Z represents a hydrogen atom or a substituent. * represents a linking site with a residue of the compound (A);
申请公布号 US2015086911(A1) 申请公布日期 2015.03.26
申请号 US201414560650 申请日期 2014.12.04
申请人 FUJIFILM Corporation 发明人 TSURUTA Takuya;TSUCHIMURA Tomotaka;YATSUO Tadeteru
分类号 G03F7/027;G03F7/20 主分类号 G03F7/027
代理机构 代理人
主权项 1. An actinic ray-sensitive or radiation-sensitive resin composition comprising: a compound (A) which generates an acid by irradiation with actinic rays or radiation, wherein the acid is linked with a group represented by the following general formula (M) through covalent bonding. wherein, in the formula, Y1 and Y2 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an alkenyl group, an alkynyl group, an aryl group, or an acyl group; Z represents a hydrogen atom or a substituent; and * represents a linking site with a residue of the compound (A).
地址 Tokyo JP