发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A ferroelectric capacitor formed above a semiconductor substrate includes a lower electrode, a dielectric film (ferroelectric film) having ferroelectric characteristics, and an upper electrode. The upper electrode includes a conductive oxide film made of a ferroelectric material to which conductivity is provided by adding a conductive material such as Ir, and the conductive oxide film is in contact with the dielectric film. |
申请公布号 |
US2015084160(A1) |
申请公布日期 |
2015.03.26 |
申请号 |
US201414557836 |
申请日期 |
2014.12.02 |
申请人 |
FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
WANG Wensheng |
分类号 |
H01L49/02 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor substrate; a capacitor formed above the semiconductor substrate, and having a lower electrode, a ferroelectric film, and an upper electrode; and a conductive oxide film provided between the ferroelectric film and the upper electrode, and having the same structure as a structure of the ferroelectric film, and containing a ferroelectric material provided with conductivity. |
地址 |
Yokohama-shi JP |