发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A ferroelectric capacitor formed above a semiconductor substrate includes a lower electrode, a dielectric film (ferroelectric film) having ferroelectric characteristics, and an upper electrode. The upper electrode includes a conductive oxide film made of a ferroelectric material to which conductivity is provided by adding a conductive material such as Ir, and the conductive oxide film is in contact with the dielectric film.
申请公布号 US2015084160(A1) 申请公布日期 2015.03.26
申请号 US201414557836 申请日期 2014.12.02
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 WANG Wensheng
分类号 H01L49/02 主分类号 H01L49/02
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate; a capacitor formed above the semiconductor substrate, and having a lower electrode, a ferroelectric film, and an upper electrode; and a conductive oxide film provided between the ferroelectric film and the upper electrode, and having the same structure as a structure of the ferroelectric film, and containing a ferroelectric material provided with conductivity.
地址 Yokohama-shi JP