TWO PORT VECTOR NETWORK ANALYZER USING DE-EMBED PROBES

摘要

A test and measurement system including a device under test, two de-embed probes connected to the device under test, and a test and measurement instrument connected to the two de-embed probes. The test and measurement instrument includes a processor configured to determine the S-parameter set of the device under test based on measurements from the device under test taken by the two de-embed probes.

主权项

1. A method for determining an S-parameter set of a device under test using a test and measurement instrument, comprising:
measuring an impedance of a signal generator with a first de-embed probe; measuring an input voltage to the device under test with the first de-embed probe connected to the input of the device under test; measuring an output voltage from the device under test with a second de-embed probe connected to the output of the device under test; measuring three loads of the device under test with the first de-embed probe connected to the input of the device under test and the second de-embed probe connected to the output of the device under test; and calculating the S-parameter set of the device under test based on the impedance of the signal generator, the input voltage to and the output voltage from the device under test, and the measured three loads of the device under test.