发明名称 TRANSISTOR STRUCTURE AND METHOD WITH AN EPITAXIAL LAYER OVER MULTIPLE HALO IMPLANTS
摘要 A transistor structure having an epitaxial layer deposited over an implanted substrate in order to reduce process variability. The epitaxial layer is able to be deposited doped, un-doped or lightly doped via up-diffusion from the implanted substrate, and used to form the channel for the transistor structure. As a result, this use of un-doped epitaxial layer provides the benefit of reducing process variability (e.g. random dopant fluctuation) and thus the transistor performance variability despite the small physical size of the transistors.
申请公布号 US2015084108(A1) 申请公布日期 2015.03.26
申请号 US201414229102 申请日期 2014.03.28
申请人 Saha Samar 发明人 Saha Samar
分类号 H01L27/092;H01L21/8238 主分类号 H01L27/092
代理机构 代理人
主权项 1. A transistor structure comprising: a first control gate; a semiconductor substrate doped to a first conductivity type; a first shallow halo implant region of the first conductivity type at a first depth in a portion of the substrate that at least partially extends under the first control gate; a first deep halo implant region of the first conductivity type at a second depth in a portion of the substrate that at least partially extends under the first control gate, wherein the second depth is greater than the first depth; an epitaxial layer formed on top of the substrate and below the first control gate; and a first source region and a first drain region both of a second conductivity type and formed in the epitaxial layer over the first shallow halo implant and the first deep halo implant and to the sides of the first control gate.
地址 Milpitas CA US