发明名称 |
METHOD FOR MANUFACTURING A LIGHT-EMITTING DIODE |
摘要 |
The present disclosure provides a method for manufacturing a light-emitting diode, including: providing a substrate; forming a first semiconductor layer over the substrate; forming an active layer over the first semiconductor layer; forming a second semiconductor layer over the active layer; removing a portion of the second semiconductor layer and a portion of the active layer to expose a portion of the first semiconductor layer; conform to depositing a transparent conductive layer; forming a patterned mask layer over the transparent conductive layer; performing a wet etch process to remove a portion of the transparent conductive layer; performing a dry etch process to completely remove the portion of the transparent conductive layer not covered by the patterned mask layer; removing the patterned mask layer; and forming a first electrode and a second electrode. |
申请公布号 |
US2015087097(A1) |
申请公布日期 |
2015.03.26 |
申请号 |
US201414276938 |
申请日期 |
2014.05.13 |
申请人 |
LEXTAR ELECTRONICS CORPORATION |
发明人 |
TSOU Po-Hung;CHOU Tzu-Hung |
分类号 |
H01L33/00;H01L33/42 |
主分类号 |
H01L33/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a light-emitting diode, comprising:
providing a substrate; forming a first semiconductor layer over the substrate, wherein the first semiconductor layer has a first conductivity type; forming an active layer over the first semiconductor layer; forming a second semiconductor layer over the active layer, wherein the second semiconductor layer has a second conductivity type different from the first conductivity type; removing a portion of the second semiconductor layer and a portion of the active layer to expose a portion of the first semiconductor layer; conform to depositing a transparent conductive layer over a top surface and sidewalls of the second semiconductor layer and over the exposed portion of the first semiconductor layer; forming a patterned mask layer over the transparent conductive layer to cover a portion of the transparent conductive layer disposed over the second semiconductor layer; performing a wet etch process to remove a portion of the transparent conductive layer not covered by the patterned mask layer; after the wet etch process, performing a dry etch process to completely remove the portion of the transparent conductive layer not covered by the patterned mask layer; removing the patterned mask layer; forming a first electrode over the transparent conductive layer; and forming a second electrode over the portion of the first semiconductor layer not covered by the active layer. |
地址 |
HSINCHU TW |