发明名称 Semiconductor Device and Method of Controlling Warpage in Reconstituted Wafer
摘要 A semiconductor device has a substrate with a stiffening layer disposed over the substrate. The substrate has a circular shape or rectangular shape. A plurality of semiconductor die is disposed over a portion of the substrate while leaving an open area of the substrate devoid of the semiconductor die. The open area of the substrate devoid of the semiconductor die includes a central area or interstitial locations among the semiconductor die. The semiconductor die are disposed around a perimeter of the substrate. An encapsulant is deposited over the semiconductor die and substrate. The substrate is removed and an interconnect structure is formed over the semiconductor die. By leaving the predetermined areas of the substrate devoid of semiconductor die, the warping effect of any mismatch between the CTE of the semiconductor die and the CTE of the encapsulant on the reconstituted wafer after removal of the substrate is reduced.
申请公布号 US2015084213(A1) 申请公布日期 2015.03.26
申请号 US201314036193 申请日期 2013.09.25
申请人 STATS ChipPAC, Ltd. 发明人 Heng Kian Meng;Goh Hin Hwa;Caparas Jose Alvin;Chen Kang;Chow Seng Guan;Lin Yaojian
分类号 H01L21/56;H01L23/28 主分类号 H01L21/56
代理机构 代理人
主权项 1. A method of making a semiconductor device, comprising: providing a plurality of semiconductor die; providing a substrate; disposing the semiconductor die over a portion of the substrate while leaving a predetermined area of the substrate devoid of the semiconductor die; and depositing an encapsulant over the semiconductor die and substrate.
地址 Singapore SG