METHOD OF FAILURE ANALYSIS

摘要

In some methods, a number of input data sets is provided for an integrated circuit (IC) model. A number of scores for the number of input data sets, respectively, are then determined based on probabilities of the respective input data sets resulting in a failure condition, which exists when the IC model fails to meet a predetermined yield criteria. A simulation order for the number of input data sets is then assigned according to the determined number of scores.

主权项

1. A simulation method, comprising:
providing a plurality of input data sets for an integrated circuit (IC) model; performing a first simulation by applying a first of the plurality of input data sets to the IC model to generate a first simulation result, wherein the first input data set includes a first input device parameter with a first baseline parametric value and a second input device parameter with a second baseline parametric value; performing a second simulation by applying a second of the plurality of input data sets to the IC model to generate a second simulation result, wherein the second input data set includes the first input device parameter but with a first parametric value that differs from the first baseline parametric value and also includes the second input device parameter with the second baseline parametric value; determining a sensitivity of the IC model to the first input device parameter by comparing results of the first and second simulations; and defining a simulation order for remaining input data sets of the plurality of input data sets according to the sensitivity of the IC model to the first input device parameter.