发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a transistor in which a channel is formed on an oxide semiconductor, and which has stable electric characteristics, suppress fluctuation of a threshold voltage of the transistor in which the channel is formed on the oxide semiconductor, and provide a normally-off type switching element having positive threshold voltage in the n-channel type transistor in which the channel is formed on the oxide semiconductor.SOLUTION: A base insulation layer is formed on a substrate, an oxide semiconductor layer is formed on the base insulation layer, a first gate insulation layer is formed on the oxide semiconductor layer, a second gate insulation layer is formed on the first gate insulation layer by the sputtering method or the atomic layer deposition method at the substrate temperature of 100°C or higher and a gate electrode layer is formed on the second gate insulation layer.</p>
申请公布号 JP2015057818(A) 申请公布日期 2015.03.26
申请号 JP20140159796 申请日期 2014.08.05
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L21/336;H01L21/316;H01L21/318;H01L21/363;H01L21/471;H01L21/473;H01L21/8234;H01L21/8238;H01L21/8242;H01L27/08;H01L27/088;H01L27/092;H01L27/108;H01L29/786 主分类号 H01L21/336
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