发明名称 レジスト組成物、レジストパターン形成方法
摘要 A resist composition including a base component (A) which exhibits changed solubility in a developing solution under the action of acid, an acid generator component (B) which generates acid upon exposure, and a nitrogen-containing organic compound component (D), wherein the acid generator component (B) includes an acid generator (B1) containing a compound represented by general formula (b1-1) shown below, and the nitrogen-containing organic compound component (D) includes a compound (D1) represented by general formula (d1) shown below. In the formula, Y0 represents an alkylene group of 1 to 4 carbon atoms which may have a substituent, R0 represents an alkyl group, alkoxy group, halogen atom, halogenated alkyl group, hydroxyl group or oxygen atom (═O), p represents 0 or 1, and Z+ represents an organic cation.
申请公布号 JP5690584(B2) 申请公布日期 2015.03.25
申请号 JP20100292648 申请日期 2010.12.28
申请人 東京応化工業株式会社 发明人 黒澤 剛志;遠藤 浩太朗;鈴木 優一;岩澤 裕太
分类号 G03F7/004;G03F7/039 主分类号 G03F7/004
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