The present invention relates to a power semiconductor device which comprises: a drift layer of a first conductivity type where a trench gate is formed; a well region of a second conductivity type formed to contact with the trench gate on an upper part of the drift layer; a source region of a first conductivity type formed to contact with the trench gate on an upper part of the well region; and a device protection region formed lower that the height of a lowest part of the source region in a height direction.
申请公布号
KR20150031668(A)
申请公布日期
2015.03.25
申请号
KR20130111140
申请日期
2013.09.16
申请人
SAMSUNG ELECTRO-MECHANICS CO., LTD.
发明人
SUNG, JAE KYU;PARK, JAE HOON;UM, KI JOO;SONG, IN HYUK