发明名称 SEMICONDUCTOR DEVICE WITH JUNCTION TERMINATION EXTENSION
摘要 A semiconductor device includes a substrate including silicon carbide; a drift layer disposed over the substrate including a drift region doped with a first dopant and conductivity type; and a second region, doped with a second dopant and conductivity type, adjacent to the drift region and proximal to a surface of the drift layer. The semiconductor device further includes a junction termination extension adjacent to the second region with a width and discrete regions separated in a first and second direction doped with varying concentrations of the second dopant type, and an effective doping profile of the second conductivity type of functional form that generally decreases away from the edge of the primary blocking junction. The width is less than or equal to a multiple of five times the width of the one-dimensional depletion width, and the charge tolerance of the semiconductor device is greater than 1.0×1013 per cm2.
申请公布号 EP2850660(A1) 申请公布日期 2015.03.25
申请号 EP20130728572 申请日期 2013.05.15
申请人 GENERAL ELECTRIC COMPANY 发明人 ARTHUR, STEPHEN, DALEY;BOLOTNIKOV, ALEXANDER, VIKTOROVICH;LOSEE, PETER, ALMEM;MATOCHA, KEVIN, SEAN;SAIA, RICHARD, JOSEPH;STUM, ZACHARY, MATTHEW;STEVANOVIC, LJUBISA, DRAGOLJUB;KISHORE, KUNA, VENKAT SATYA RAMA;KRETCHMER, JAMES, WILLIAM
分类号 H01L29/861;H01L21/266;H01L29/06;H01L29/16;H01L29/739;H01L29/78 主分类号 H01L29/861
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