发明名称 |
Control method of a fundus examination apparatus |
摘要 |
<p>A control method of a fundus examination apparatus configured to examine a fundus (Ef) of an examinee's eye (E), includes: processing an examination data obtained by one of fundus examination apparatuses, which are a perimeter (400) configured to measure a visual field and an optical coherence tomography device (100) configured to obtain a tomographic image of the fundus, to thereby obtain positional information relating to an abnormal site of the fundus; setting an examination position on the fundus in the other fundus examination apparatus which is the perimeter or the optical coherence tomography device based on the positional information; and examining the abnormal site of the fundus by controlling the other fundus examination apparatus based on the set examination position.</p> |
申请公布号 |
EP2449957(B1) |
申请公布日期 |
2015.03.25 |
申请号 |
EP20110187640 |
申请日期 |
2011.11.03 |
申请人 |
NIDEK CO., LTD. |
发明人 |
TORII, HISANARI;MURATA, TOSHIO;KONDO, NAOYUKI |
分类号 |
A61B3/024;A61B3/10;A61B3/12 |
主分类号 |
A61B3/024 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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