发明名称 Control method of a fundus examination apparatus
摘要 <p>A control method of a fundus examination apparatus configured to examine a fundus (Ef) of an examinee's eye (E), includes: processing an examination data obtained by one of fundus examination apparatuses, which are a perimeter (400) configured to measure a visual field and an optical coherence tomography device (100) configured to obtain a tomographic image of the fundus, to thereby obtain positional information relating to an abnormal site of the fundus; setting an examination position on the fundus in the other fundus examination apparatus which is the perimeter or the optical coherence tomography device based on the positional information; and examining the abnormal site of the fundus by controlling the other fundus examination apparatus based on the set examination position.</p>
申请公布号 EP2449957(B1) 申请公布日期 2015.03.25
申请号 EP20110187640 申请日期 2011.11.03
申请人 NIDEK CO., LTD. 发明人 TORII, HISANARI;MURATA, TOSHIO;KONDO, NAOYUKI
分类号 A61B3/024;A61B3/10;A61B3/12 主分类号 A61B3/024
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