发明名称 |
Magnetic tunneling junction devices, memories, memory systems, and electronic devices |
摘要 |
Provided is a magnetic tunneling junction device including a first structure including a magnetic layer; a second structure including at least two extrinsic perpendicular magnetization structures, each including a magnetic layer and; a perpendicular magnetization inducing layer on the magnetic layer; and a tunnel barrier between the first and second structures. |
申请公布号 |
US8987798(B2) |
申请公布日期 |
2015.03.24 |
申请号 |
US201414306792 |
申请日期 |
2014.06.17 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Park Jeong Heon;Lim Woo Chang;Oh Se Chung;Kim Young Hyun;Park Sang Hwan;Lee Jang Eun |
分类号 |
H01L43/02;H01L43/08;H01L43/10;G06F13/16 |
主分类号 |
H01L43/02 |
代理机构 |
Harness, Dickey & Pierce, P.L.C. |
代理人 |
Harness, Dickey & Pierce, P.L.C. |
主权项 |
1. A magnetic tunneling junction device comprising:
a first structure including a magnetic layer; a second structure including a first extrinsic perpendicular magnetization layer; a second extrinsic perpendicular magnetization layer; a first non-magnetic layer disposed on the first extrinsic perpendicular magnetization layer; a second non-magnetic layer disposed on the second extrinsic perpendicular magnetization layer; and a third non-magnetic layer disposed on the second non-magnetic layer. |
地址 |
Gyeonggi-do KR |