发明名称 Magnetic tunneling junction devices, memories, memory systems, and electronic devices
摘要 Provided is a magnetic tunneling junction device including a first structure including a magnetic layer; a second structure including at least two extrinsic perpendicular magnetization structures, each including a magnetic layer and; a perpendicular magnetization inducing layer on the magnetic layer; and a tunnel barrier between the first and second structures.
申请公布号 US8987798(B2) 申请公布日期 2015.03.24
申请号 US201414306792 申请日期 2014.06.17
申请人 Samsung Electronics Co., Ltd. 发明人 Park Jeong Heon;Lim Woo Chang;Oh Se Chung;Kim Young Hyun;Park Sang Hwan;Lee Jang Eun
分类号 H01L43/02;H01L43/08;H01L43/10;G06F13/16 主分类号 H01L43/02
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A magnetic tunneling junction device comprising: a first structure including a magnetic layer; a second structure including a first extrinsic perpendicular magnetization layer; a second extrinsic perpendicular magnetization layer; a first non-magnetic layer disposed on the first extrinsic perpendicular magnetization layer; a second non-magnetic layer disposed on the second extrinsic perpendicular magnetization layer; and a third non-magnetic layer disposed on the second non-magnetic layer.
地址 Gyeonggi-do KR