发明名称 Apparatus and methods of programming memory cells using adjustable charge state level(s)
摘要 Apparatus and methods are disclosed, including a method of programming involving determining an error rate for the memory cells, and programming the memory cells using a charge state level for a charge state that is based at least in part on the determined error rate.
申请公布号 US8990644(B2) 申请公布日期 2015.03.24
申请号 US201113335291 申请日期 2011.12.22
申请人 Micron Technology, Inc. 发明人 Seabury John L.;Liikanen Bruce A.
分类号 G06F11/00;G06F11/10 主分类号 G06F11/00
代理机构 Pritzkau Patent Group, LLC 代理人 Pritzkau Patent Group, LLC
主权项 1. A method for programming memory cells, the method comprising: error correcting data in the memory cells with error correcting code; identifying a target error rate based on a tolerance of the error correcting code to errors; determining an observed error rate for the memory cells; and programming data to the memory cells using a charge state level for a charge state that is based at least in part on a relationship between the target error rate and the determined observed error rate such that the charge state level is at least approximately equal to a minimum charge state level that yields the determined observed error rate as no greater than the target error rate.
地址 Boise ID US