发明名称 |
Three dimensional semiconductor memory devices and methods of manufacturing the same |
摘要 |
Nonvolatile memory devices include a vertical stack of nonvolatile memory cells. The vertical stack of nonvolatile memory cells includes a first nonvolatile memory cell having a first gate pattern therein, which is separated from a vertical active region by a first multi-layered dielectric pattern having a first thickness, and a second nonvolatile memory cell having a second gate pattern therein, which is separated from the vertical active region by a second multi-layered dielectric pattern having a second thickness. The second gate pattern is also separated from the first gate pattern by a distance less than a sum of the first and second thicknesses. |
申请公布号 |
US8987803(B2) |
申请公布日期 |
2015.03.24 |
申请号 |
US201213425584 |
申请日期 |
2012.03.21 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Chae Soodoo;Hwang Kihyun;Choi Hanmei;Lim SeungHyun |
分类号 |
H01L29/78;H01L27/115;G11C5/02;G11C16/04 |
主分类号 |
H01L29/78 |
代理机构 |
Myers Bigel Sibley & Sajovec, PA |
代理人 |
Myers Bigel Sibley & Sajovec, PA |
主权项 |
1. A nonvolatile memory device, comprising:
a vertical stack of nonvolatile memory cells on a substrate, said vertical stack of nonvolatile memory cells comprising a first nonvolatile memory cell having a first gate pattern therein separated from a vertical active region by a first multi-layered dielectric pattern having a first thickness, and a second nonvolatile memory cell having a second gate pattern therein separated from the vertical active region by a second multi-layered dielectric pattern having a second thickness equivalent to the first thickness and also separated from the first gate pattern by a portion of the first multi-layered dielectric pattern but not a corresponding portion of the second multi-layer dielectric pattern. |
地址 |
KR |