发明名称 Three dimensional semiconductor memory devices and methods of manufacturing the same
摘要 Nonvolatile memory devices include a vertical stack of nonvolatile memory cells. The vertical stack of nonvolatile memory cells includes a first nonvolatile memory cell having a first gate pattern therein, which is separated from a vertical active region by a first multi-layered dielectric pattern having a first thickness, and a second nonvolatile memory cell having a second gate pattern therein, which is separated from the vertical active region by a second multi-layered dielectric pattern having a second thickness. The second gate pattern is also separated from the first gate pattern by a distance less than a sum of the first and second thicknesses.
申请公布号 US8987803(B2) 申请公布日期 2015.03.24
申请号 US201213425584 申请日期 2012.03.21
申请人 Samsung Electronics Co., Ltd. 发明人 Chae Soodoo;Hwang Kihyun;Choi Hanmei;Lim SeungHyun
分类号 H01L29/78;H01L27/115;G11C5/02;G11C16/04 主分类号 H01L29/78
代理机构 Myers Bigel Sibley & Sajovec, PA 代理人 Myers Bigel Sibley & Sajovec, PA
主权项 1. A nonvolatile memory device, comprising: a vertical stack of nonvolatile memory cells on a substrate, said vertical stack of nonvolatile memory cells comprising a first nonvolatile memory cell having a first gate pattern therein separated from a vertical active region by a first multi-layered dielectric pattern having a first thickness, and a second nonvolatile memory cell having a second gate pattern therein separated from the vertical active region by a second multi-layered dielectric pattern having a second thickness equivalent to the first thickness and also separated from the first gate pattern by a portion of the first multi-layered dielectric pattern but not a corresponding portion of the second multi-layer dielectric pattern.
地址 KR