发明名称 |
Semiconductor device and method for fabricating the same |
摘要 |
A semiconductor device includes: a first well and a second well formed in a substrate and having a different impurity doping concentration; a first isolation layer and a second isolation layer formed in the first well and the second well, respectively, and having a different depth; and a third isolation layer formed in a boundary region in which the first well and the second well are in contact with each other, and having a combination type of the first isolation layer and the second isolation layer. |
申请公布号 |
US8987112(B2) |
申请公布日期 |
2015.03.24 |
申请号 |
US201313917990 |
申请日期 |
2013.06.14 |
申请人 |
MagnaChip Semiconductor, Ltd. |
发明人 |
Oh Bo-Seok |
分类号 |
H01L21/762;H01L21/8234 |
主分类号 |
H01L21/762 |
代理机构 |
NSIP Law |
代理人 |
NSIP Law |
主权项 |
1. A method for fabricating a semiconductor device, comprising:
forming a first well and a second well having a different impurity doping concentration on a substrate; etching the substrate to form a trench in a boundary region in which the first well and the second well are in contact with each other such that a first side of the trench is disposed in the first well and a second side of the trench is disposed in the second well; forming a sacrificial pattern to cover the first side of the trench without covering the second side of the trench; etching an exposed bottom surface of the second side of the trench by using the sacrificial pattern as an etch barrier; removing the sacrificial pattern; and filling the trench with an insulation material to form an isolation layer having two different depths with respect to a top surface of the substrate. |
地址 |
Cheongju-si KR |