发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device includes: a first well and a second well formed in a substrate and having a different impurity doping concentration; a first isolation layer and a second isolation layer formed in the first well and the second well, respectively, and having a different depth; and a third isolation layer formed in a boundary region in which the first well and the second well are in contact with each other, and having a combination type of the first isolation layer and the second isolation layer.
申请公布号 US8987112(B2) 申请公布日期 2015.03.24
申请号 US201313917990 申请日期 2013.06.14
申请人 MagnaChip Semiconductor, Ltd. 发明人 Oh Bo-Seok
分类号 H01L21/762;H01L21/8234 主分类号 H01L21/762
代理机构 NSIP Law 代理人 NSIP Law
主权项 1. A method for fabricating a semiconductor device, comprising: forming a first well and a second well having a different impurity doping concentration on a substrate; etching the substrate to form a trench in a boundary region in which the first well and the second well are in contact with each other such that a first side of the trench is disposed in the first well and a second side of the trench is disposed in the second well; forming a sacrificial pattern to cover the first side of the trench without covering the second side of the trench; etching an exposed bottom surface of the second side of the trench by using the sacrificial pattern as an etch barrier; removing the sacrificial pattern; and filling the trench with an insulation material to form an isolation layer having two different depths with respect to a top surface of the substrate.
地址 Cheongju-si KR