发明名称 |
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, DEFECT INSPECTION PROGRAM AND RECORDING MEDIUM |
摘要 |
<p>PROBLEM TO BE SOLVED: To detect a defect on a surface of a rotating object without affine transform, in visual inspection using a line sensor which images an annular or sectoral surface area of the object in a rotation radius direction or a substantial rotation radius direction.SOLUTION: A defect inspection device visually inspects an object by use of a line sensor 5 which images an annular or sectoral surface area of a rotating object in a rotation radius direction or a substantial rotation radius direction. An area dividing unit 39 of an image processing board 15 divides image data captured by the line sensor 5 or a pixel array region of the processed image data into multiple sub-areas in an axial direction corresponding to an arrangement direction of the line sensor 5. A defect detection unit 45 detects a defect on the surface of the object by executing pattern matching by use of a template group formed for each of the sub-areas.</p> |
申请公布号 |
JP2015055580(A) |
申请公布日期 |
2015.03.23 |
申请号 |
JP20130189908 |
申请日期 |
2013.09.12 |
申请人 |
RICOH CO LTD |
发明人 |
KURABAYASHI MASARU;MIYAMOTO KEIICHI;IWASAKI MITSUTAKA |
分类号 |
G01N21/88;G06T1/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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