发明名称 DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, DEFECT INSPECTION PROGRAM AND RECORDING MEDIUM
摘要 <p>PROBLEM TO BE SOLVED: To detect a defect on a surface of a rotating object without affine transform, in visual inspection using a line sensor which images an annular or sectoral surface area of the object in a rotation radius direction or a substantial rotation radius direction.SOLUTION: A defect inspection device visually inspects an object by use of a line sensor 5 which images an annular or sectoral surface area of a rotating object in a rotation radius direction or a substantial rotation radius direction. An area dividing unit 39 of an image processing board 15 divides image data captured by the line sensor 5 or a pixel array region of the processed image data into multiple sub-areas in an axial direction corresponding to an arrangement direction of the line sensor 5. A defect detection unit 45 detects a defect on the surface of the object by executing pattern matching by use of a template group formed for each of the sub-areas.</p>
申请公布号 JP2015055580(A) 申请公布日期 2015.03.23
申请号 JP20130189908 申请日期 2013.09.12
申请人 RICOH CO LTD 发明人 KURABAYASHI MASARU;MIYAMOTO KEIICHI;IWASAKI MITSUTAKA
分类号 G01N21/88;G06T1/00 主分类号 G01N21/88
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