发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device provided with a composition having good processability; and provide a manufacturing method of the semiconductor device.SOLUTION: A semiconductor device comprises a semiconductor substrate 2 and a plurality of memory cell transistors arranged on the semiconductor substrate 2. The memory cell transistor has a gate MG which includes: a charge storage layer 4 formed via a gate insulation film formed on the semiconductor substrate 2; a first insulation film 5 formed on the charge storage layer 4; and a control gate electrode 6 formed on the first insulation film 5. The control gate includes a metal film 7 containing nitrogen in a top face and an oxide film 9 formed on the top face of the metal film 7. |
申请公布号 |
JP2015056601(A) |
申请公布日期 |
2015.03.23 |
申请号 |
JP20130190602 |
申请日期 |
2013.09.13 |
申请人 |
TOSHIBA CORP |
发明人 |
MURATA SHOTARO;NODA KOTARO;NAGASHIMA MASASHI |
分类号 |
H01L21/8247;H01L21/336;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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