发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device provided with a composition having good processability; and provide a manufacturing method of the semiconductor device.SOLUTION: A semiconductor device comprises a semiconductor substrate 2 and a plurality of memory cell transistors arranged on the semiconductor substrate 2. The memory cell transistor has a gate MG which includes: a charge storage layer 4 formed via a gate insulation film formed on the semiconductor substrate 2; a first insulation film 5 formed on the charge storage layer 4; and a control gate electrode 6 formed on the first insulation film 5. The control gate includes a metal film 7 containing nitrogen in a top face and an oxide film 9 formed on the top face of the metal film 7.
申请公布号 JP2015056601(A) 申请公布日期 2015.03.23
申请号 JP20130190602 申请日期 2013.09.13
申请人 TOSHIBA CORP 发明人 MURATA SHOTARO;NODA KOTARO;NAGASHIMA MASASHI
分类号 H01L21/8247;H01L21/336;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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