| 摘要 |
FIELD: measurement equipment.SUBSTANCE: invention relates to measurement equipment, represents a method to measure magnetic properties and thickness of nanosize magnetic films and may be used in magnetic nanoelectronis to characterise heterogenic magnetic elements in memory devices, in sensor devices, etc. In realisation of the method the film with the help of an inductive system of open type is magnetised in alternating field in presence of direct field, they measure even high harmonics, arising as a result of symmetry loss by direct field, and for analysis they use the ratio of their amplitudes.EFFECT: increased functional flexibility of the method, also its applicability for in situ characterisation of magnetic films, and expanded range of its application, in particular, to characterise nanosize film structures.4 dwg |
