Test interface board and test system including the same

摘要

Provided are a test interface board and a test system including the same. The test interface board comprises a substrate and a voltage regulator formed on the substrate. The substrate includes a power plane and a ground plane which are respectively electrically connected to at least one power terminal and at least one ground terminal of a tested semiconductor device. The voltage regulator supplies a driving voltage to the tested semiconductor device through the power plane and the ground plane, thereby improving a margin of an operation voltage in a test process.