| 摘要 |
<p>Disclosed are an inositol crystal, preparation method therefor and use thereof. The X-ray powder diffraction (XRPD) pattern of crystal form C has characteristic peaks at the following angles of 2θ±0.2°： 14.86°, 17.82°, 20.38°, 25.32°, 26.42°, 28.39°, 31.28° and 34.33°.</p> |
