发明名称 High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors
摘要 This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.
申请公布号 US2015078519(A1) 申请公布日期 2015.03.19
申请号 US201414454295 申请日期 2014.08.07
申请人 Rapiscan Systems, Inc. 发明人 Morton Edward James
分类号 G01V5/00;G01N23/20 主分类号 G01V5/00
代理机构 代理人
主权项 1. A scanning method for scanning an object in a scanning zone, the method comprising: irradiating the object with a radiation source having a peak energy of at least 900 keV, wherein the object is irradiated over a plurality of regions to be scanned within a single irradiation event; detecting radiation scattered from the object wherein said scattered radiation is detected from a predefined part of the scanning zone via a detector having a plurality of detector elements; and, calculating a scatter intensity across the plurality of detector elements using a signal processor.
地址 Torrance CA US