发明名称 |
High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors |
摘要 |
This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements. |
申请公布号 |
US2015078519(A1) |
申请公布日期 |
2015.03.19 |
申请号 |
US201414454295 |
申请日期 |
2014.08.07 |
申请人 |
Rapiscan Systems, Inc. |
发明人 |
Morton Edward James |
分类号 |
G01V5/00;G01N23/20 |
主分类号 |
G01V5/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A scanning method for scanning an object in a scanning zone, the method comprising:
irradiating the object with a radiation source having a peak energy of at least 900 keV, wherein the object is irradiated over a plurality of regions to be scanned within a single irradiation event; detecting radiation scattered from the object wherein said scattered radiation is detected from a predefined part of the scanning zone via a detector having a plurality of detector elements; and, calculating a scatter intensity across the plurality of detector elements using a signal processor. |
地址 |
Torrance CA US |