MEASUREMENT DEVICE FOR TEXTURE SIZE, MANUFACTURING SYSTEM FOR SOLAR CELL, AND MANUFACTURING METHOD FOR SOLAR CELL

摘要

A manufacturing method for a solar cell, wherein after a texture is formed on a principal surface of a substrate, infrared light in a predetermined wave number range is applied to a portion, on which the texture is formed, of the principal surface, a wave number at a specified transmission detection rate of the infrared light transmitted through the substrate and detected is acquired, the Tx size of the substrate is calculated on the basis of the acquired wave number using a previously obtained relationship between the wave number at the specified transmission detection rate and the Tx size, and when the calculated Tx size is within a reference value range, a collecting electrode is formed on the principal surface.

主权项

1. A measurement device of a texture size, comprising:
a light source that emits an infrared ray in a predetermined wave number range; a holder that holds a substrate for a solar cell over which a texture is formed such that the infrared ray is incident over a primary surface of the substrate; and a detector that detects an intensity of the infrared ray transmitted through the substrate.