发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device according to the present embodiment includes a semiconductor layer. A gate dielectric film is provided on a surface of the semiconductor layer. A gate electrode is provided on the semiconductor layer via the gate dielectric film. A drain layer of a first conductivity type is provided in a part of the semiconductor layer on a side of a first end of the gate electrode. A source layer of a second conductivity type is provided in a part of the semiconductor layer on a side of a second end of the gate electrode and below the gate electrode. The source layer has a substantially uniform impurity concentration at the part of the semiconductor layer below the gate electrode. Voltages of a same polarity are applied to the gate electrode and the drain layer.
申请公布号 US2015076553(A1) 申请公布日期 2015.03.19
申请号 US201314145141 申请日期 2013.12.31
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KONDO Yoshiyuki;GOTO Masakazu;KAWANAKA Shigeru;MIYATA Toshitaka
分类号 H01L29/66;H01L29/78 主分类号 H01L29/66
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor layer; a gate dielectric film provided on a surface of the semiconductor layer; a gate electrode provided on the semiconductor layer via the gate dielectric film; a drain layer of a first conductivity type provided in a part of the semiconductor layer on a side of a first end of the gate electrode; and a source layer of a second conductivity type provided in a part of the semiconductor layer on a side of a second end of the gate electrode and below the gate electrode, the source layer having a substantially uniform impurity concentration at the part of the semiconductor layer below the gate electrode, wherein voltages of a same polarity are applied to the gate electrode and the drain layer.
地址 Tokyo JP