发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device according to the present embodiment includes a semiconductor layer. A gate dielectric film is provided on a surface of the semiconductor layer. A gate electrode is provided on the semiconductor layer via the gate dielectric film. A drain layer of a first conductivity type is provided in a part of the semiconductor layer on a side of a first end of the gate electrode. A source layer of a second conductivity type is provided in a part of the semiconductor layer on a side of a second end of the gate electrode and below the gate electrode. The source layer has a substantially uniform impurity concentration at the part of the semiconductor layer below the gate electrode. Voltages of a same polarity are applied to the gate electrode and the drain layer. |
申请公布号 |
US2015076553(A1) |
申请公布日期 |
2015.03.19 |
申请号 |
US201314145141 |
申请日期 |
2013.12.31 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KONDO Yoshiyuki;GOTO Masakazu;KAWANAKA Shigeru;MIYATA Toshitaka |
分类号 |
H01L29/66;H01L29/78 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor layer; a gate dielectric film provided on a surface of the semiconductor layer; a gate electrode provided on the semiconductor layer via the gate dielectric film; a drain layer of a first conductivity type provided in a part of the semiconductor layer on a side of a first end of the gate electrode; and a source layer of a second conductivity type provided in a part of the semiconductor layer on a side of a second end of the gate electrode and below the gate electrode, the source layer having a substantially uniform impurity concentration at the part of the semiconductor layer below the gate electrode, wherein voltages of a same polarity are applied to the gate electrode and the drain layer. |
地址 |
Tokyo JP |