发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device includes a substrate and memory cell transistors having a gate electrode above the substrate, and an oxide film. The gate electrode includes a charge storage layer above the substrate, a first insulating film on the charge storage layer, and a control gate electrode on the first insulating film, the control gate electrode including a metal film. The oxide film is disposed on the metal film.
申请公布号 US2015076583(A1) 申请公布日期 2015.03.19
申请号 US201414195781 申请日期 2014.03.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MURATA Shotaro;NODA Kotaro;NAGASHIMA Satoshi
分类号 H01L27/115;H01L21/32 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate; and memory cell transistors having a gate electrode above the semiconductor substrate, wherein the gate electrode comprises: a charge storage layer formed above the semiconductor substrate;a first insulating film formed on the charge storage layer; anda control gate electrode formed on the first insulating film, the control gate electrode including a metal film containing nitrogen, and an oxide film formed on a top surface of the metal film.
地址 Tokyo JP