发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A semiconductor device includes a substrate and memory cell transistors having a gate electrode above the substrate, and an oxide film. The gate electrode includes a charge storage layer above the substrate, a first insulating film on the charge storage layer, and a control gate electrode on the first insulating film, the control gate electrode including a metal film. The oxide film is disposed on the metal film. |
申请公布号 |
US2015076583(A1) |
申请公布日期 |
2015.03.19 |
申请号 |
US201414195781 |
申请日期 |
2014.03.03 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MURATA Shotaro;NODA Kotaro;NAGASHIMA Satoshi |
分类号 |
H01L27/115;H01L21/32 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a semiconductor substrate; and memory cell transistors having a gate electrode above the semiconductor substrate, wherein the gate electrode comprises:
a charge storage layer formed above the semiconductor substrate;a first insulating film formed on the charge storage layer; anda control gate electrode formed on the first insulating film, the control gate electrode including a metal film containing nitrogen, and an oxide film formed on a top surface of the metal film. |
地址 |
Tokyo JP |