发明名称 MEMORY DEVICE
摘要 According to one embodiment, a memory device includes a first electrode, a second electrode and a variable resistance layer. The second electrode includes a metal. The metal is more easily ionizable than a material of the first electrode. The variable resistance layer is disposed between the first electrode and the second electrode. The variable resistance layer includes a first layer and a second layer. The first layer has a relatively high crystallization rate. The second layer contacts the first layer. The second layer has a relatively low crystallization rate. The first layer and the second layer are stacked along a direction connecting the first electrode and the second electrode.
申请公布号 US2015076439(A1) 申请公布日期 2015.03.19
申请号 US201414446419 申请日期 2014.07.30
申请人 Kabushiki Kaisha Toshiba 发明人 SAITOH Masumi;ISHIKAWA Takayuki;FUJII Shosuke;MIYAGAWA Hidenori;TANAKA Chika;MIZUSHIMA Ichiro
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A memory device, comprising: a first electrode; a second electrode including a metal, the metal being more easily ionizable than a material of the first electrode; and a variable resistance layer disposed between the first electrode and the second electrode, the variable resistance layer including: a first layer having a relatively high crystallization rate; anda second layer contacting the first layer, the second layer having a relatively low crystallization rate, the first layer and the second layer being stacked along a direction connecting the first electrode and the second electrode.
地址 Minato-ku JP