| 摘要 |
PROBLEM TO BE SOLVED: To provide a high frequency characteristics-measuring jig device capable of precisely measuring a high-frequency element.SOLUTION: A high frequency characteristics-measuring jig device includes: a ground conductor section 10; a first coplanar line 20; a connection substrate 30; and a pressing section. The first coplanar line 20 includes a first dielectric layer 21, a first central conductive layer 22, and a first ground conductive layer 26. The connection substrate 30 includes a second dielectric layer 31, a second central conductive layer 32, a second ground conductive layer 36, and a third ground conductive layer 40. The second dielectric layer 31 includes: a first area LA where the second conductive layer 32 and the second ground conductive layer 36 are provided; and a second area RA where the second ground conductive layer 36 is not provided. The pressing section presses the connection substrate 30 against each of the first coplanar line 20 and a signal terminal 50a so as to achieve electric conduction between the first and second central conductive layers 22 and 32, between the first and second grounding conductive layers 26 and 36 and between the second central conductive layer 32 in the second area RA and the signal terminal 50a. |
