| 发明名称 |
SYSTEM AND METHOD FOR TESTING CERAMIC COATINGS |
| 摘要 |
A method of testing for impurities includes directing an x-ray source toward a surface at an angle α relative to the plane of the surface, the surface defined by a ceramic coating over a crystalline substrate; detecting electromagnetic radiation emitted from the ceramic coating at an angle θ different from the angle α and its supplementary angle; and comparing characteristics of the detected electromagnetic radiation to characteristics associated with impurities. |
| 申请公布号 |
US2015078517(A1) |
申请公布日期 |
2015.03.19 |
| 申请号 |
US201414487089 |
申请日期 |
2014.09.15 |
| 申请人 |
Cerium Laboratories |
发明人 |
Hossain Timothy |
| 分类号 |
G01N23/223;G01N33/38 |
主分类号 |
G01N23/223 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of testing for impurities, the method comprising:
directing an x-ray source toward a surface at an angle α relative to the plane of the surface, the surface defined by a ceramic coating over a crystalline substrate; detecting electromagnetic radiation emitted from the ceramic coating at an angle θ different from the angle α and its supplementary angle; and comparing characteristics of the detected electromagnetic radiation to characteristics associated with impurities. |
| 地址 |
Austin TX US |
