发明名称 Electron microscope with a phase plate
摘要 <p>#CMT# #/CMT# The phase plate is made of a thin film (8d - 8f) that is partially permeable to electron beams. The thin film is made of an electrically conducting material, and is connected to a predetermined electric voltage (12a - 12c), and has penetration openings (9a - 9c). The thin film is made of amorphous, electrical conductive material, such as gold, aluminum, silver, platinum, titanium and its alloys. #CMT#USE : #/CMT# Phase plate, particularly for an electron microscope, disposed in an electron beam path (Claimed). #CMT#ADVANTAGE : #/CMT# The thin film is made of an electrically conducting material, and is connected to a predetermined electric voltage, and has penetration openings, and thus ensures an increased resolution. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a schematic sectional view of an electron microscope with a phase plate. 7 : Optical axis 8d - 8f : Thin films 9a - 9c : Penetration openings 12a - 12c : Electric voltages 17,18 : Outer walls.</p>
申请公布号 EP2159818(B1) 申请公布日期 2015.03.18
申请号 EP20080163121 申请日期 2008.08.28
申请人 MAX-PLANCK-GESELLSCHAFT ZUR FÖRDERUNG DER WISSENSCHAFTEN E.V. 发明人 BARTON, BASTIAN;SCHRÖDER, RASMUS R.
分类号 H01J37/26 主分类号 H01J37/26
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