发明名称 |
A METHOD OF FABRICATING STRAIN-RELAXED SI-GE BUFFER LAYER AND SI-GE BUFFER LAYER FABRICATED THEREBY |
摘要 |
<p>The present invention relates to a method of fabricating a strain-relaxed Si-Ge buffer layer and a Si-Ge buffer layer fabricated thereby. The present invention manufactures a strain-relaxed Si-Ge buffer layer by a simple process as compared with an existing fabricating method by directly injecting a Ge in plasma ion in a silicon wafer and using a post heat treat process.</p> |
申请公布号 |
KR101503000(B1) |
申请公布日期 |
2015.03.18 |
申请号 |
KR20130125355 |
申请日期 |
2013.10.21 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
HAN, SEUNG HEE;KIM, SUNG MIN;KIM, KYUNG HUN;LEE, GEUN HYUK |
分类号 |
H01L21/20;H01L21/203;H01L21/265 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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