发明名称 A METHOD OF FABRICATING STRAIN-RELAXED SI-GE BUFFER LAYER AND SI-GE BUFFER LAYER FABRICATED THEREBY
摘要 <p>The present invention relates to a method of fabricating a strain-relaxed Si-Ge buffer layer and a Si-Ge buffer layer fabricated thereby. The present invention manufactures a strain-relaxed Si-Ge buffer layer by a simple process as compared with an existing fabricating method by directly injecting a Ge in plasma ion in a silicon wafer and using a post heat treat process.</p>
申请公布号 KR101503000(B1) 申请公布日期 2015.03.18
申请号 KR20130125355 申请日期 2013.10.21
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 HAN, SEUNG HEE;KIM, SUNG MIN;KIM, KYUNG HUN;LEE, GEUN HYUK
分类号 H01L21/20;H01L21/203;H01L21/265 主分类号 H01L21/20
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