| 摘要 |
An imprint apparatus transfers a pattern formed on a mold to a resin on a substrate. The imprint apparatus includes a shape correction mechanism configured to apply a force to the mold to thereby deform a pattern region formed on the mold; a heating mechanism configured to heat a substrate-side pattern region formed on the substrate to thereby deform the substrate-side pattern region; and a control unit configured to obtain information regarding a difference between shapes of the pattern region formed on the mold and the substrate-side pattern region and control the shape correction mechanism and the wafer heating mechanism so as to reduce the difference between the shapes of the pattern region formed on the mold and the substrate-side pattern region based on the obtained information. |
