发明名称 Method and apparatus for simultaneous RF testing of multiple devices in specific frequency bands
摘要 A system employing vector signal generator (VSG) and vector signal analyzer (VSA) modules or cards that are configured to test multiple devices under test simultaneously. Each VSG is configured to generate multiple RF test signals and send them to multiple devices under test simultaneously. Similarly, each VSA is configured with multiple signal receiving modules connected to a single controller or memory. Each signal receiving module receives an RF signal from a device under test, converts it to a baseband digital signal, and transmits this digital signal to the VSA's memory. A single RF testing system can employ multiple such VSGs and VSAs, each capable of evaluating multiple devices under test. Each VSG/VSA can further be tuned for operation in discrete or defined frequency bands, which are narrower than those for conventional RF testers, and which can correspond to various wireless standards.
申请公布号 US8982936(B2) 申请公布日期 2015.03.17
申请号 US201213443254 申请日期 2012.04.10
申请人 Insight Scientific International (Shanghai) Ltd. 发明人 Yang Michael Shih Chiang;Guo Lin
分类号 H04B17/00 主分类号 H04B17/00
代理机构 Innovation Counsel LLP 代理人 Innovation Counsel LLP
主权项 1. A modular radio frequency (RF) testing system, comprising: a first vector signal generator configured to transmit RF test signals to one or more devices using only a first communication standard; a first vector signal analyzer configured to receive RF test signals from one or more devices using only the first communication standard; a second vector signal generator configured to transmit RF test signals to one or more devices using only a second communication standard; and a second vector signal analyzer configured to receive RF test signals from one or more devices using only the second communication standard, wherein the first communication standard and the second communication standard employ different frequency bands and different modulation schemes for communication, and each of the first vector signal generator and the second vector signal generator includes a plurality of generator modules, each generator module configured to: receive a digital representation of a test signal,generate the RF test signal from the digital representation of a test signal, andtransmit its generated RF test signal to a device under test.
地址 CN