发明名称 Methods and apparatus for testing radio-frequency power amplifier performance
摘要 Wireless communications circuitry such as radio-frequency power amplifiers may be tested using a test station. A test station may include a test host and a test unit coupled to the test host. The power amplifiers may be configured to transmit radio-frequency signals in allocated resource blocks within a particular radio channel. The power amplifier circuits may be configured to transmit signals utilizing only an allocated portion of its total available resource blocks so that the transmitted signals are output at maximum power levels. The power amplifiers may transmit in resource blocks near a low channel edge during a first time period and may transmit in resource blocks near a high channel edge during a second time period. The test unit may receive the signals generated from the power amplifiers and may perform desired radio-frequency measurements (e.g., test unit may measure adjacent channel leakage radio, signal-to-interference ratio, error vector magnitude, etc.).
申请公布号 US8983395(B2) 申请公布日期 2015.03.17
申请号 US201113323709 申请日期 2011.12.12
申请人 Apple Inc. 发明人 Luong Anh;Kong Daniel C.
分类号 H04B17/00;H04W24/06 主分类号 H04B17/00
代理机构 Treys Law Group 代理人 Treys Law Group ;Tsai Jason
主权项 1. A method for using a test station to test a device under test, wherein the test station includes a test unit, the method comprising: with the test unit, receiving radio-frequency test signals from the device under test that have been transmitted at a maximum output power level in a subset of resource blocks within an Orthogonal Frequency-Division Multiplexing (OFDM) radio-frequency channel, wherein the Orthogonal Frequency-Division Multiplexing radio-frequency channel is bounded by lower and upper edges and the subset of resource blocks are only positioned adjacent a selected one of the lower and upper edges of the Orthogonal Frequency-Division Multiplexing radio-frequency channel.
地址 Cupertino CA US