发明名称 Inertial measurement systems, and methods of use and manufacture thereof
摘要 A micro-electro-mechanical systems (MEMS) inertial measurement system facilitates accurate location and/or attitude measurements via passive thermal management of MEMS inertial sensors. Accuracy of the system is also improved by subjecting the inertial sensors to programmed single-axis gimbal motion, and by performing coarse and fine adjustments to the attitude estimates obtained by the system based on the programmed motion and on the passive thermal management of the sensors.
申请公布号 US8978474(B2) 申请公布日期 2015.03.17
申请号 US201113194574 申请日期 2011.07.29
申请人 The Charles Stark Draper Laboratory, Inc.;Massachusetts Institute of Technology 发明人 Bottkol Matthew S.;Elliott Richard D.;Feng Michael Y.;Marinis Thomas F.;Mcmanus Michael F.;Mohiuddin Shan;Sherman Peter G.;Pritchett John E.;Warren Jeffery W.;Lange Charles H.
分类号 G01P15/08;H05K3/30;H05K1/02 主分类号 G01P15/08
代理机构 Lando & Anastasi, LLP 代理人 Lando & Anastasi, LLP
主权项 1. An inertial-measurement system, comprising: a micro-electro-mechanical systems (MEMS) inertial sensor having a sensor contact and being constructed to provide an indication of motion; a circuit board comprising circuitry constructed to receive the indication of motion from the inertial sensor and generate a sensor signal based on the indication of motion, the circuit board disposed in proximity to the inertial sensor without being in direct physical contact therewith; and a thermal impedance path coupling the circuit board to the sensor contact, the thermal impedance path comprising a material having a thermal conductivity lower than that of copper.
地址 Cambridge MA US