发明名称 |
Memory array having improved radiation immunity |
摘要 |
A memory array having improved radiation immunity is described. The memory array comprises a plurality of memory elements, each memory element having an p-type transistor formed in an n-type region; and a plurality of p-wells, each p-well having an n-type transistor coupled to a corresponding p-type transistor to form a memory element of the plurality of memory elements; wherein each p-well provides a p-n junction to dissipate minority charge in a portion of the n-type region occupied by a corresponding p-type transistor and associated with at least two adjacent memory elements. A method of implementing a memory array is also described. |
申请公布号 |
US8981491(B1) |
申请公布日期 |
2015.03.17 |
申请号 |
US201213439706 |
申请日期 |
2012.04.04 |
申请人 |
Xilinx, Inc. |
发明人 |
Hart Michael J.;Karp James |
分类号 |
H01L27/085 |
主分类号 |
H01L27/085 |
代理机构 |
|
代理人 |
King John J. |
主权项 |
1. A memory array having improved radiation immunity, comprising:
a plurality of memory elements; wherein each memory element has a pair of p-wells and an n-type region; wherein, for each memory element, each p-well has an n-type transistor coupled to a corresponding p-type transistor in the n-type region and is surrounded on at least three sides by the n-type region; and wherein, for each memory element, each p-well provides a p-n junction to dissipate minority charge in a portion of the n-type region occupied by a corresponding p-type transistor and associated with at least two adjacent memory elements. |
地址 |
San Jose CA US |