发明名称 Memory array having improved radiation immunity
摘要 A memory array having improved radiation immunity is described. The memory array comprises a plurality of memory elements, each memory element having an p-type transistor formed in an n-type region; and a plurality of p-wells, each p-well having an n-type transistor coupled to a corresponding p-type transistor to form a memory element of the plurality of memory elements; wherein each p-well provides a p-n junction to dissipate minority charge in a portion of the n-type region occupied by a corresponding p-type transistor and associated with at least two adjacent memory elements. A method of implementing a memory array is also described.
申请公布号 US8981491(B1) 申请公布日期 2015.03.17
申请号 US201213439706 申请日期 2012.04.04
申请人 Xilinx, Inc. 发明人 Hart Michael J.;Karp James
分类号 H01L27/085 主分类号 H01L27/085
代理机构 代理人 King John J.
主权项 1. A memory array having improved radiation immunity, comprising: a plurality of memory elements; wherein each memory element has a pair of p-wells and an n-type region; wherein, for each memory element, each p-well has an n-type transistor coupled to a corresponding p-type transistor in the n-type region and is surrounded on at least three sides by the n-type region; and wherein, for each memory element, each p-well provides a p-n junction to dissipate minority charge in a portion of the n-type region occupied by a corresponding p-type transistor and associated with at least two adjacent memory elements.
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