发明名称 |
Optical characteristic measuring apparatus |
摘要 |
In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1. By disposing, on a position of a focal point of the partial ellipsoidal mirror, a hemispherical detection optical system having a hemispherical lens or a rotational parabolic mirror, light scattered by an object, reflected by the partial ellipsoidal mirror, and focused on the point is photographed by for example a CCD camera 6 via a hemispherical lens and a taper fiber 5 so as to measure an optical characteristic of the object. |
申请公布号 |
US8982345(B2) |
申请公布日期 |
2015.03.17 |
申请号 |
US201214003201 |
申请日期 |
2012.03.08 |
申请人 |
National Institute of Advanced Industrial Science and Technology |
发明人 |
Kawate Etsuo;Hain Miroslav |
分类号 |
G01N21/49;G01N21/47;G01N21/59;G02B19/00 |
主分类号 |
G01N21/49 |
代理机构 |
McCormick, Paulding & Huber LLP |
代理人 |
McCormick, Paulding & Huber LLP |
主权项 |
1. An optical characteristic measuring apparatus for measuring scattered light from an object, comprising:
a double ellipsoidal optical system composed of a partial ellipsoidal mirror and a belt-shape ellipsoidal mirror, and a hemispherical detection optical system, wherein the partial ellipsoidal mirror has, at least, a structure cut along a plane passing through an axis of the double ellipsoidal optical system and a plane perpendicular to the axis and passing through a common focal point, and wherein the hemispherical detection optical system is disposed at a position of a focal point of the partial ellipsoidal mirror. |
地址 |
Tokyo JP |