发明名称 Semiconductor devices and method of manufacturing the same
摘要 Disclosed are semiconductor devices and methods of manufacturing the same. The semiconductor device includes active portions defined in a semiconductor substrate, a device isolation pattern in a trench formed between the active portions, a gate electrode in a gate recess region crossing the active portions and the device isolation pattern, a gate dielectric layer between the gate electrode and an inner surface of the gate recess region, and a first ohmic pattern and a second ohmic pattern on each of the active portions at both sides of the gate electrode, respectively. The first and second ohmic patterns include a metal-semiconductor compound, and a top surface of the device isolation pattern at both sides of the gate recess region is recessed to be lower than a level of a top surface of the semiconductor substrate.
申请公布号 US8981468(B2) 申请公布日期 2015.03.17
申请号 US201313943208 申请日期 2013.07.16
申请人 Samsung Electronics Co., Ltd. 发明人 Nam Ki-hyung;Kim Yong Kwan;Park Chan Ho;Cho Pulunsol
分类号 H01L29/78;H01L29/66;H01L45/00;H01L27/22 主分类号 H01L29/78
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A semiconductor device, comprising: active portions defined in a semiconductor substrate; a device isolation pattern in a trench between the active portions; a gate electrode in a gate recess region crossing the active portions and the device isolation pattern; a gate dielectric layer between the gate electrode and an inner surface of the gate recess region; and a first ohmic pattern and a second ohmic pattern on each of the active portions at both sides of the gate electrode, respectively, the first and second ohmic patterns including a metal-semiconductor compound, wherein a top surface of the device isolation pattern at both sides of the gate recess region is recessed to be lower than a level of a top surface of the semiconductor substrate.
地址 Suwon-si, Gyeonggi-do KR