发明名称 |
Semiconductor devices and method of manufacturing the same |
摘要 |
Disclosed are semiconductor devices and methods of manufacturing the same. The semiconductor device includes active portions defined in a semiconductor substrate, a device isolation pattern in a trench formed between the active portions, a gate electrode in a gate recess region crossing the active portions and the device isolation pattern, a gate dielectric layer between the gate electrode and an inner surface of the gate recess region, and a first ohmic pattern and a second ohmic pattern on each of the active portions at both sides of the gate electrode, respectively. The first and second ohmic patterns include a metal-semiconductor compound, and a top surface of the device isolation pattern at both sides of the gate recess region is recessed to be lower than a level of a top surface of the semiconductor substrate. |
申请公布号 |
US8981468(B2) |
申请公布日期 |
2015.03.17 |
申请号 |
US201313943208 |
申请日期 |
2013.07.16 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Nam Ki-hyung;Kim Yong Kwan;Park Chan Ho;Cho Pulunsol |
分类号 |
H01L29/78;H01L29/66;H01L45/00;H01L27/22 |
主分类号 |
H01L29/78 |
代理机构 |
Lee & Morse, P.C. |
代理人 |
Lee & Morse, P.C. |
主权项 |
1. A semiconductor device, comprising:
active portions defined in a semiconductor substrate; a device isolation pattern in a trench between the active portions; a gate electrode in a gate recess region crossing the active portions and the device isolation pattern; a gate dielectric layer between the gate electrode and an inner surface of the gate recess region; and a first ohmic pattern and a second ohmic pattern on each of the active portions at both sides of the gate electrode, respectively, the first and second ohmic patterns including a metal-semiconductor compound, wherein a top surface of the device isolation pattern at both sides of the gate recess region is recessed to be lower than a level of a top surface of the semiconductor substrate. |
地址 |
Suwon-si, Gyeonggi-do KR |