<p>The present invention relates to an apparatus for determining a state of a brainwave measuring signal. The present invention has a purpose to determine an adhering degree of a brainwave sensor to a head of an examinee in measuring the brainwave of the examinee through the brainwave sensor; to determine a noise state by measuring and analyzing a movement state of a head and a stress state of the examinee; and to determine a reliability of the measured brainwave. The purpose of the present invention is realized by comprising a pressure sensor to sense a adhering degree of a brainwave sensor to a head of an examinee; a photoplethysmogram sensor to sense photoplethysmogram of the examinee; an acceleration and gyro sensor to measure movement of an examinee′s head; and a microcontroller to calculate a noise generated by a contact failure of the brainwave sensor and the movement state of the examinee in the brainwave measurement of the examinee by analyzing a signal obtained from each sensor and to determine a stress state of the examinee in an apparatus to determine accuracy of a brainwave measuring signal to determine the accuracy of the brainwave measured by sensing the state of the examinee when the brainwave is measured through the brainwave sensor attached to the head of the examinee.</p>
申请公布号
KR20150028451(A)
申请公布日期
2015.03.16
申请号
KR20130107004
申请日期
2013.09.06
申请人
LIFE SCIENCE TECHNOLOGY INC.
发明人
KIM, JEONG HWAN;CHOI, GI YOUNG;YANG, DONG IN;JUN, JAE WOO;JEONG, JIN HWA