发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE |
摘要 |
The objective of the present invention is to provide a semiconductor device which has a thin film transistor with superior electrical properties by using an oxide semiconductor layer. To reduce contact resistance with a line layer made of a metallic material with a low electric resistance value by using an In-Sn-O based oxide semiconductor layer including SiOx in a channel region, a source region or a drain region is formed between a source electrode layer and a drain electrode layer and the In-Sn-O based oxide semiconductor layer including SiOx. The source region or the drain region, and a pixel region use an In-Sn-O based oxide semiconductor layer excluding SiOx of the same layer. |
申请公布号 |
KR20150028795(A) |
申请公布日期 |
2015.03.16 |
申请号 |
KR20150016111 |
申请日期 |
2015.02.02 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
OIKAWA YOSHIAKI;MARUYAMA HOTAKA;GODO HIROMICHI;KAWAE DAISUKE;YAMAZAKI SHUNPEI |
分类号 |
G02F1/1343;H01L21/02;H01L27/12;H01L27/32;H01L29/786 |
主分类号 |
G02F1/1343 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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