发明名称 横向双扩散金氧半导体装置及其制造方法;LATERAL DOUBLE DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
摘要 一种横向双扩散金氧半导体装置,包括:半导体基板,具有相对之一第一表面与一第二表面;井区,位于该半导体基板之一部内;闸极结构,位于该半导体基板之一部上;第一掺杂区,位于邻近该闸极结构之一第一侧之该井区层之一部内;一第二掺杂区,位于该闸极结构之一第二侧之该井区之一部内;第三掺杂区,位于该第一掺杂区之一部内;一第四掺杂区,位于该第二掺杂区之一部内;第一沟槽,位于该第三掺杂区、该第一掺杂区、该井区与该半导体基板之一部中;导电接触物,位于该第一沟槽内;第二沟槽,位于邻近该半导体基板之该第二表面之一部中;第一导电层,位于该第二沟槽内;以及第二导电层,位于该半导体基板之该第二表面以及该第一导电层上。; a well region in a portion of the semiconductor substrate; a gate structure disposed over a portion of the semiconductor substrate; a first doping region disposed in a portion of the well region from a first side of the gate structure; a second doping region disposed in a portion of the well region from a second side of the gate structure; a third doping region disposed in a portion of the first doping region; a fourth doping region disposed in a portion of the second doping region; a first trench formed in a portion of the third doping region, the first doping region, the well region and the semiconductor substrate; a conductive contact in the first trench; a second trench in a portion of the semiconductor substrate adjacent to the second surface thereof; a first conductive layer in the second trench; and a second conductive layer on the second surface of the semiconductor substrate and the first conductive layer.
申请公布号 TW201511270 申请公布日期 2015.03.16
申请号 TW102133327 申请日期 2013.09.14
申请人 世界先进积体电路股份有限公司 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 李琮雄 LEE, TSUNG HSIUNG;张睿钧 CHANG, JUI CHUN
分类号 H01L29/78(2006.01);H01L21/28(2006.01) 主分类号 H01L29/78(2006.01)
代理机构 代理人 洪澄文颜锦顺
主权项
地址 新竹县新竹科学工业园区园区三路123号 TW