发明名称 |
横向双扩散金氧半导体装置及其制造方法;LATERAL DOUBLE DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME |
摘要 |
一种横向双扩散金氧半导体装置,包括:半导体基板,具有相对之一第一表面与一第二表面;井区,位于该半导体基板之一部内;闸极结构,位于该半导体基板之一部上;第一掺杂区,位于邻近该闸极结构之一第一侧之该井区层之一部内;一第二掺杂区,位于该闸极结构之一第二侧之该井区之一部内;第三掺杂区,位于该第一掺杂区之一部内;一第四掺杂区,位于该第二掺杂区之一部内;第一沟槽,位于该第三掺杂区、该第一掺杂区、该井区与该半导体基板之一部中;导电接触物,位于该第一沟槽内;第二沟槽,位于邻近该半导体基板之该第二表面之一部中;第一导电层,位于该第二沟槽内;以及第二导电层,位于该半导体基板之该第二表面以及该第一导电层上。; a well region in a portion of the semiconductor substrate; a gate structure disposed over a portion of the semiconductor substrate; a first doping region disposed in a portion of the well region from a first side of the gate structure; a second doping region disposed in a portion of the well region from a second side of the gate structure; a third doping region disposed in a portion of the first doping region; a fourth doping region disposed in a portion of the second doping region; a first trench formed in a portion of the third doping region, the first doping region, the well region and the semiconductor substrate; a conductive contact in the first trench; a second trench in a portion of the semiconductor substrate adjacent to the second surface thereof; a first conductive layer in the second trench; and a second conductive layer on the second surface of the semiconductor substrate and the first conductive layer. |
申请公布号 |
TW201511270 |
申请公布日期 |
2015.03.16 |
申请号 |
TW102133327 |
申请日期 |
2013.09.14 |
申请人 |
世界先进积体电路股份有限公司 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
李琮雄 LEE, TSUNG HSIUNG;张睿钧 CHANG, JUI CHUN |
分类号 |
H01L29/78(2006.01);H01L21/28(2006.01) |
主分类号 |
H01L29/78(2006.01) |
代理机构 |
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代理人 |
洪澄文颜锦顺 |
主权项 |
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地址 |
新竹县新竹科学工业园区园区三路123号 TW |