发明名称 MATERIAL MEASUREMENT APPARATUS
摘要 <p>According to an embodiment of the present invention, a material characteristic measurement apparatus comprises: a first port including a first coaxial line section having a first outer conductor; a second port including a second coaxial line section having a second outer conductor; and a third coaxial line section which a first guide ring arranged between the first and second coaxial line sections, wherein a sample is fixed. The characteristic impedance of the third coaxial line section is different from the characteristic impedance of the first and second coaxial line sections. The first outer conductor, the second outer conductor, and the first guide ring may be made of a metallic material.</p>
申请公布号 KR101502557(B1) 申请公布日期 2015.03.16
申请号 KR20130139611 申请日期 2013.11.18
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 KWON, JAE YONG;KANG, NO WEON;LEE, DONG JOON
分类号 G01N27/02 主分类号 G01N27/02
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