ON-CENTER ELECTRICALLY CONDUCTIVE PINS FOR INTEGRATED TESTING

摘要

A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper and lower section and a hinge in between which allow flex of both upper and lower contact which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins by use of a modified hinge. In an alternate embodiment, the lower section includes a leg extension and a sliding contact land which slides against an aperture in the housing. A spacer provides space for decoupling components on the load board. The hinge may include a truncated cylinder (40b) which is configured to permit remove of the upper pin without removal of the lower.