发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of a high-speed operation, and to provide a semiconductor device having high reliability.SOLUTION: An oxide semiconductor having crystallinity is used for a semiconductor layer of a transistor, and a channel formation region, a source region and a drain region are formed in the semiconductor layer. The source region and the drain region are formed by performing an ion doping method or an ion implantation method of one or a plurality types of elements selected from rare gas or hydrogen into the semiconductor layer by using a channel protection layer as a mask.
申请公布号 JP2015046642(A) 申请公布日期 2015.03.12
申请号 JP20140249849 申请日期 2014.12.10
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;H01L21/336;H01L21/8242;H01L21/8244;H01L27/108;H01L27/11 主分类号 H01L29/786
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