| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray stress measurement tool capable of measuring a stress by irradiating a test piece over a wide angle with X rays, and to provide an X-ray diffraction device.SOLUTION: An X-ray stress measurement jig has paired test piece-holding stages 3 which are disposed on a rectangular plate 1 and apply a bend stress or a tensile stress to a test piece S by increase or decrease in space between the test piece-holding stages 3. At least one of the paired test piece-holding stages 3 is movable in the horizontal direction, and stress application members 7 for applying a stress to the test piece S are stood above the paired test piece-holding stages 3 to deform the test piece S in the horizontal direction, and a height of the stress application members 7 are equal to or less than that of the test piece S. The X-ray diffraction device is loaded with the X-ray stress measurement tool. |
