| 摘要 |
PROBLEM TO BE SOLVED: To contribute to efficiently repairing a defective memory cell.SOLUTION: A semiconductor device includes: an address serial converter circuit that converts a defective address signal to a serial signal and that outputs the serial signal as an address serial conversion signal; a bit determination circuit to which the address serial conversion signal is supplied, that counts the number of times by which the supplied address serial conversion signal is at high level as a high level count, and outputs whether the high level count exceeds a predetermined determination threshold as a bit determination result signal; and a selection control circuit that selects a program element to be disconnected on the basis of the bit determination result signal. |
