发明名称 |
CIRCUITRY AND METHODS FOR USE IN MIXED-SIGNAL CIRCUITRY |
摘要 |
A method of calibrating switching circuitry, the switching circuitry comprising a measurement node and a plurality of output switches connected to the measurement node, and the circuitry being configured, in each clock cycle of a series of clock cycles, to control whether or not one or more of said output switches carry a given current based upon input data, the method comprising: inputting a plurality of different data sequences to the circuitry, each sequence causing a given pattern of voltages to occur at the measurement node as a result of currents passing through the output switches; measuring the voltages occurring at the measurement node for each said sequence; and calibrating the switching circuitry in dependence upon a result of said measuring. |
申请公布号 |
US2015070199(A1) |
申请公布日期 |
2015.03.12 |
申请号 |
US201314025330 |
申请日期 |
2013.09.12 |
申请人 |
FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
DEDIC Ian Juso;Darzy Saul;Allen Gavin Lambertus |
分类号 |
H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
1. A method of calibrating switching circuitry, the switching circuitry comprising a measurement node and a plurality of output switches connected to the measurement node, and the circuitry being configured, in each clock cycle of a series of clock cycles, to control whether or not one or more of said output switches carry a given current based upon input data, the method comprising:
inputting a plurality of different data sequences to the circuitry, each sequence causing a given pattern of voltages to occur at the measurement node as a result of currents passing through the output switches; measuring the voltages occurring at the measurement node for each said sequence; and calibrating the switching circuitry in dependence upon a result of said measuring. |
地址 |
YOKOHAMA-SHI JP |